Statistically sound evaluation of trace element depth profiles by ion beam analysis

Elemental thin film depth profiles by ion beam analysis using simulated annealing—a new tool

Rutherford backscattering spectrometry (RBS) and related techniques have long been used to determine the elemental depth profiles in films a few nanometres to a few microns thick. However, although obtaining spectra is very easy, solving the inverse problem of extracting the depth profiles from the spectra is not possible analytically except for special cases. It is because these special cases ...

Nitrogen incorporation and trace element analysis of nanocrystalline diamond thin films by secondary ion mass spectrometry

Nitrogen has been successfully incorporated into nanocrystalline diamond films produced by a CH4 /N2 microwave plasma-enhanced chemical vapor deposition method. High mass resolution secondary ion mass spectrometry ~SIMS! characterization shows that the density of the incorporated nitrogen, monitored via CN, can be as high as 10 atoms/cm, depending on the ratio of CH4 to N2 in the reactant gas a...

evaluation of fat atrophy in patients with dermis fat graft of orbit by ct-scan

چکیده ندارد.

Ion beam analysis.

Ultra-Sensitive CoUinear Fast Ion Beam Trace Detection of ̂ K̂r

A novel scheme of coUinear fast beam laser spectroscopy for the detection of the long lived rare isotope *^Kr by observing the optical hyperfme structure spectrum is presented. The technique utilizes cascade two-step excitation to pump metastable krypton atoms to a high-lying Rydberg level. The present work on krypton was motivated by the fact that *̂ Kr is a major tracer gas for exploring the r...